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R S Sirohi; Sirohi

R S Sirohi; Sirohi Optical Science and Engineering: Speckle Metrology (Series #38) (Hardcover)

R S Sirohi; Sirohi Optical Science and Engineering: Speckle Metrology (Series #38) (Hardcover)

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This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry.;Examing every important aspect of the field, Speckle Metrology: surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysis and shape measurement of rough objects; explains particle image velocimetry (PIV), the processing of PIV records, and the design requirements of PIV equipment; discusses the applications of white light speckle methods and the production of artificial speckles; describes the measurement of surface roughness with laser speckles and polychromatic speckles; illustrates semiautomatic and automatic methods for the analysis of Young's fringes; calculates the variation of Young's fringes with the change in the microrelief of the rough surface; and explicates hololenses for imaging and provides design details with aberration corrections for hololense systems.;With over 1500 literature citations, tables, figures and display equations, Speckle Metrology is a resource for students and professionals in the fields of optical, mechanical, electrical and electronics engineering; applied physics; and stress analysis. This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry.;Examing every important aspect of the field, Speckle Metrology: surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysis and shape measurement of rough objects; explains particle image velocimetry (PIV), the processing of PIV records, and the design requirements of PIV equipment; discusses the applications of white light speckle methods and the production of artificial speckles; describes the measurement of surface roughness with laser speckles and polychromatic speckles; illustrates semiautomatic and automatic methods for the analysis of Young's fringes; calculates the variation of Young's fringes with the change in the microrelief of the rough surface; and explicates hololenses for imaging and provides design details with aberration corrections for hololense systems.;With over 1500 literature citations, tables, figures and display equations, Speckle Metrology is a resource for students and professionals in the fields of optical, mechanical, electrical and electronics engineering; applied physics; and stress analysis. • Author: Sirohi • ISBN:9780824789329 • Format:Hardcover • Publication Date:1993-05-20

Specifications

Language

English

Series Title

Optical Science and Engineering

Publisher

CRC Press

Book Format

Hardcover

Number of Pages

568

Author

R S Sirohi

Title

Speckle Metrology

ISBN-13

9780824789329

Publication Date

May, 1993

Assembled Product Dimensions (L x W x H)

9.12 x 6.24 x 1.22 Inches

ISBN-10

0824789326

SKU: WA38540358

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